GLTRS--Glenn
TITLE AND SUBTITLE:
Surface Diagnostics in Tribology Technology and Advanced Coatings Development

AUTHOR(S):
Kazuhisa Miyoshi

REPORT DATE:
February 1999

FUNDING NUMBERS:
WU-523-22-13-00

PERFORMING ORGANIZATION NAME(S) AND ADDRESS(ES):
National Aeronautics and Space Administration
Lewis Research Center
Cleveland, Ohio 44135-3191

PERFORMING ORGANIZATION REPORT NUMBER:
E-11460

SPONSORING/MONITORING AGENCY NAME(S) AND ADDRESS(ES):
National Aeronautics and Space Administration
Washington, DC 20546-0001

REPORT TYPE AND DATES COVERED:
Technical Memorandum

SPONSORING/MONITORING AGENCY REPORT NUMBER:
NASA TM-1999-208527

SUPPLEMENTARY NOTES:
Prepared for IMECO-XV sponsored by the Society of Instrumentation and Control Engineers, Osaka, Japan, June 13-15, 1999. Responsible person, Kazuhiza Miyoshi, organization code 5140, (216) 433-6068.

ABSTRACT:
This paper discusses the methodologies used for surface property measurement of thin films and coatings, lubricants, and materials in the field of tribology. Surface diagnostic techniques include scanning electron microscopy, transmission electron microscopy, atomic force microscopy, stylus profilometry, x-ray diffraction, electron diffraction, Raman spectroscopy,
Rutherford backscattering, elastic recoil spectroscopy, and tribology examination. Each diagnostic technique provides specific measurement results in its own unique way. In due course it should be possible to coordinate the different pieces of
information provided by these diagnostic techniques into a coherent self-consistent description of the surface properties.
Examples are given on the nature and character of thin diamond films.

SUBJECT TERMS:
Measurement; Surface methodology; Diamond; Films and coatings; Tribology

NUMBER OF PAGES:
14

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